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Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL.

Matthew J. TurnquistErkka LaulainenJani MäkipääLauri Koskinen
Published in: NORCHIP (2011)
Keyphrases
  • error detection
  • error correction
  • error recovery
  • data cleansing
  • fault tolerance
  • error correcting
  • high speed
  • error resilient
  • low voltage
  • digital libraries
  • data warehouse
  • response time
  • fault tolerant
  • fault isolation