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Impact of Bottom Electrode Roughness on the Analog Switching Characteristics in Nanoscale RRAM Array.

Wenbin ZhangJianshi TangBin GaoWen SunWei LiuKanwen WangWei WuHe QianHuaqiang Wu
Published in: DRC (2021)
Keyphrases
  • neural network
  • databases
  • website
  • signal processing
  • factors that influence
  • analog vlsi
  • data mining
  • genetic algorithm
  • multiscale
  • fault diagnosis
  • focal plane
  • programmable logic
  • processor array