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Impact of the twin-gate structure on the linear kink effect in PD SOI nMOSFETS.

Paula Ghedini Der AgopianJoão Antonio MartinoEddy SimoenCor Claeys
Published in: Microelectron. J. (2006)
Keyphrases
  • negative impact
  • real world
  • data sets
  • website
  • case study
  • image sequences
  • multiscale
  • information technology
  • hierarchical structure
  • graph structure
  • linear constraints