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Analysis of bump resistance and current distribution of ultra-fine-pitch microbumps.

Y. W. ChangH. Y. PengR. W. YangChih ChenT. C. ChangChau-Jie ZhanJin-Ye JuangAnnie T. Huang
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • statistical analysis
  • wide range
  • data analysis
  • data sets
  • three dimensional
  • information technology
  • image analysis
  • probability distribution
  • automatic analysis