Login / Signup

Line-to-ground capacitance calculation for VLSI: a comparison.

Erich Barke
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
  • high speed
  • signal processing
  • vlsi design
  • unit length
  • multiscale
  • pattern recognition
  • calculation method
  • data sets
  • expert systems
  • multiresolution
  • line segments
  • low power
  • line detection