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Line-to-ground capacitance calculation for VLSI: a comparison.
Erich Barke
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
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high speed
signal processing
vlsi design
unit length
multiscale
pattern recognition
calculation method
data sets
expert systems
multiresolution
line segments
low power
line detection