Cantilever Type Probe Card for At-Speed Memory Test on Wafer.

Hitoshi Iwai Atsushi Nakayama Naoko Itoga Kotaro Omata

Published in: VTS (2005)

Keyphrases

memory size
memory access
website
memory space
low cost
high speed
real time
memory usage
data structure
smart card
computing power
test data
limited memory
processing speed
computational power
case study
feature selection
machine learning
databases