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Optimal Schemes for ADC BIST Based on Histogram.

Yongsheng WangJinxiang WangFengchang LaiYizheng Ye
Published in: Asian Test Symposium (2005)
Keyphrases
  • optimal solution
  • optimal design
  • genetic algorithm
  • multiscale
  • dynamic programming
  • database
  • feature space
  • worst case
  • low cost
  • mean shift