SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits.
Ronald WilsonOlivia P. Dizon-ParadisDomenic ForteDamon L. WoodardPublished in: IEEE Access (2023)
Keyphrases
- reverse engineering
- integrated circuit
- segmentation quality
- evaluation metrics
- segmentation algorithm
- ground truth
- software engineering
- segmented images
- edge detection
- image retrieval
- input image
- image features
- precision and recall
- region of interest
- evaluation measures
- quality evaluation
- learning to rank
- image regions
- test collection
- image segmentation algorithm
- similarity measure