An integrated CAPP/CAM system for stamping die pattern machining.

Hayong Shin Gustav J. Olling Yun C. Chung Bo Hyoung Kim Su K. Cho

Published in: Comput. Aided Des. (2003)

Keyphrases

process planning
pattern matching
computer aided
high speed
pattern detection
neural network
associative memory
content addressable memory
pattern discovery
computer aided design
social networks
video sequences