C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs.
Rosa Rodríguez-Montañés
Joan Figueras
Published in:
DATE (1998)
Keyphrases
</>
vlsi circuits
low power
power consumption
high speed
robust estimation
low cost
parameter estimation
accurate estimation
correlation analysis
real time
knn
least squares
expectation maximization
estimation accuracy
analog vlsi