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Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique.

Tien Anh NguyenPierre-Yves JoubertStéphane LefebvreG. ChaplierLionel Rousseau
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • eddy current
  • empirical studies
  • power consumption
  • semiconductor devices
  • genetic algorithm
  • sensor networks
  • high accuracy
  • experimental study
  • theoretical framework