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An in-depth study on WENO-based techniques to improve parameter extraction procedures in MOSFET transistors.
Pedro González
María J. Ibáñez
Andrés M. Roldán
Juan Bautista Roldán
Published in:
Math. Comput. Simul. (2015)
Keyphrases
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information extraction
statistical analysis
depth map
neural network
genetic algorithm
feature selection
knowledge base
bayesian networks
evolutionary algorithm
low cost
medical images
markov chain
experimental study
power consumption
simulation study