The Invariance of Characteristic Current Densities in Nanoscale MOSFETs and Its Impact on Algorithmic Design Methodologies and Design Porting of Si(Ge) (Bi)CMOS High-Speed Building Blocks.
Timothy O. DicksonKenneth H. K. YauTheodoros ChalvatzisAlain M. ManganEkaterina LaskinRudy BeerkensPaul WestergaardMihai TazlauanuMing-Ta YangSorin P. VoinigescuPublished in: IEEE J. Solid State Circuits (2006)