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Characterizing mechanical performance of Board Level Interconnects for In-Circuit Test.

Rosa D. ReinosaAileen AllenElizabeth BenedettoAlan Mcallister
Published in: ITC (2010)
Keyphrases
  • databases
  • computer vision
  • high speed
  • input output
  • levels of abstraction
  • neural network
  • genetic algorithm
  • artificial intelligence
  • higher level
  • test cases
  • circuit board