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MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs.

DongSup SongJin-Ho AhnTaejin KimSungho Kang
Published in: IEICE Trans. Inf. Syst. (2008)
Keyphrases
  • simulated annealing
  • power dissipation
  • power consumption
  • low power
  • nm technology
  • real time
  • evolutionary algorithm
  • cmos technology
  • flip flops
  • genetic algorithm
  • low cost
  • control system