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MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs.
DongSup Song
Jin-Ho Ahn
Taejin Kim
Sungho Kang
Published in:
IEICE Trans. Inf. Syst. (2008)
Keyphrases
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simulated annealing
power dissipation
power consumption
low power
nm technology
real time
evolutionary algorithm
cmos technology
flip flops
genetic algorithm
low cost
control system