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Extending Fault-Based Testing to Microelectromechanical Systems.
Salvador Mir
Benoît Charlot
Bernard Courtois
Published in:
J. Electron. Test. (2000)
Keyphrases
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expert systems
learning systems
genetic algorithm
learning environment
distributed systems
intelligent systems
computer systems
complex systems
database
neural network
real world
search engine
artificial neural networks
evolutionary algorithm
management system