A Transistor Sizing Method Applied to an Automatic Layout Generation Tool.
Cristiano SantosGustavo WilkeCristiano LazzariRicardo ReisJosé Luís Almada GüntzelPublished in: SBCCI (2003)
Keyphrases
- clustering method
- experimental evaluation
- high precision
- theoretical analysis
- detection method
- prior knowledge
- main contribution
- fully automatic
- significant improvement
- cost function
- computational cost
- high accuracy
- high speed
- optimization algorithm
- evaluation method
- objective function
- detection algorithm
- edge detection
- pairwise
- preprocessing