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mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness.

Ziad HatabMichael Ernst GadringerMariam HabibWolfgang Bösch
Published in: IEEE Trans. Instrum. Meas. (2022)
Keyphrases
  • surface roughness
  • viewpoint
  • complex systems
  • specular reflection
  • face recognition