Classification with Few Tests through Self-Selection.
Hanrui ZhangYu ChengVincent ConitzerPublished in: AAAI (2021)
Keyphrases
- classification accuracy
- support vector
- decision rules
- pattern recognition
- feature extraction
- classification scheme
- feature space
- object classification
- decision trees
- classification algorithm
- support vector machine
- classification rate
- image classification
- text classification
- benchmark datasets
- class labels
- automated classification
- classification systems
- classification process
- selection algorithm
- pattern classification
- classification method
- accuracy rate
- training samples
- svm classifier
- naive bayes
- support vector machine svm
- computer vision
- rough sets
- supervised learning
- hidden markov models
- feature vectors
- artificial neural networks
- preprocessing
- image processing
- feature selection