Planning Against Failure - It's Not All about Technology.

Lucia Lotter Marie-Louise van Wyk

Published in: IASSIST Conference (2008)

Keyphrases

data processing
cost effective
decision support
computer integrated manufacturing
key technologies
case study
data sets
multimedia
image sequences
expert systems
e learning
data mining
heuristic search
neural network
path planning
rapid development
goal oriented
failure rate
urban planning
real time