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The impact of NMOSFET hot-carrier degradation on CMOS analog subcircuit performance.
Vei-Han Chan
James E. Chung
Published in:
IEEE J. Solid State Circuits (1995)
Keyphrases
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analog vlsi
circuit design
cmos image sensor
high speed
focal plane
low cost
signal processing
power consumption
low power
image sensor
analog circuits
information technology
single chip
high impact
mixed signal
genetic algorithm
successive approximation
real world