Defect Level Prediction Using Multi-Model Fault Coverage.
Shyue-Kung LuTsung-Ying LeeCheng-Wen WuPublished in: Asian Test Symposium (1999)
Keyphrases
- prediction model
- computational model
- mathematical model
- decision making
- theoretical analysis
- high level
- formal model
- conceptual model
- experimental data
- prediction accuracy
- least squares
- management system
- probabilistic model
- artificial neural networks
- probability distribution
- neural network model
- bayesian framework
- simulation model
- prior knowledge
- linear model