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The Sample Complexity of Sparse Multireference Alignment and Single-Particle Cryo-Electron Microscopy.
Tamir Bendory
Dan Edidin
Published in:
SIAM J. Math. Data Sci. (2024)
Keyphrases
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electron microscopy
x ray
low energy
image stacks
thin film
microscopy images
high dimensional
low cost
three dimensional
evolutionary algorithm