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A New Test Procedure to Measure Power Electronic Devices' Frequency Coupling Admittance.
Daniele Gallo
Roberto Langella
Mario Luiso
Alfredo Testa
Neville R. Watson
Published in:
IEEE Trans. Instrum. Meas. (2018)
Keyphrases
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electronic devices
similarity measure
machine learning
power consumption
artificial neural networks
correlation coefficient
real world
multi agent
distance measure
bit rate
test data
quality measures
occurrence frequency