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Expected affine: A registration method for damaged section in serial sections electron microscopy.

Tong XinLijun ShenLinlin LiXi ChenHua Han
Published in: Frontiers Neuroinformatics (2022)
Keyphrases
  • missing data
  • matching algorithm
  • neural network
  • similarity measure
  • mutual information
  • medical images
  • image matching
  • electron microscopy