Automated tip functionalization via machine learning in scanning probe microscopy.
Benjamin AlldrittFedor UrtevNiko OinonenMarkus AaproJuho KannalaPeter LiljerothAdam S. FosterPublished in: Comput. Phys. Commun. (2022)
Keyphrases
- machine learning
- machine learning methods
- semi automated
- image analysis
- computational intelligence
- text mining
- data mining
- machine learning and data mining
- feature selection
- learning algorithm
- structured light
- fully automated
- inductive learning
- learning tasks
- high throughput
- automated analysis
- model selection
- knowledge representation
- computer science
- scan data
- machine learning algorithms
- computer vision
- image enhancement
- statistical methods
- pattern recognition
- reinforcement learning
- active learning
- supervised machine learning
- electron microscopy
- image processing
- decision trees
- machine learning approaches
- position and orientation
- vision system
- fully automatic
- knowledge discovery
- transfer learning
- learning systems
- support vector machine
- knowledge acquisition
- text classification