Built In Self Test for Ring Addressed FIFOs with Transparent Latches.

Larry Fenstermaker Ilyoung Kim Jim L. Lewandowski Jeffrey J. Nagy

Published in: MTDT (1999)

Keyphrases

built in self test
real time
machine learning
three dimensional
integrated circuit
database
databases
artificial intelligence
wide range
pattern recognition
preprocessing
high dimensional
image analysis
medical images