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An Automated System for Checking Lithography Friendliness of Standard Cells.
I-Lun Tseng
Yongfu Li
Valerio Perez
Vikas Tripathi
Zhao Chuan Lee
Yoong Seang Jonathan Ong
Published in:
CoRR (2018)
Keyphrases
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fully automated
neural network
search engine
computer vision
case study
artificial neural networks
semi automated
automated analysis