Breakdown behaviour of high-voltage GaN-HEMTs.

Wataru Saito Takeshi Suwa Takeshi Uchihara Toshiyuki Naka Taichi Kobayashi

Published in: Microelectron. Reliab. (2015)

Keyphrases

high voltage
operating conditions
partial discharge
structuring elements
normal operation
data mining
knowledge base
expert systems
multi class
control strategy
phase locked loop