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Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs.

Ting WuAbdullah AlharbiTakashi TaniguchiKenji WatanabeDavood Shahricrdi
Published in: DRC (2018)
Keyphrases
  • bayesian networks
  • noise level
  • data sets
  • genetic algorithm
  • computer vision
  • e learning
  • high resolution
  • input data
  • noisy data
  • image noise
  • defect detection