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Capacitance Measurements of Two-Dimensional and Three-Dimensional IC Interconnect Structures by Quasi-Static C-V Technique.

Michele StucchiDimitrios VelenisGuruprasad Katti
Published in: IEEE Trans. Instrum. Meas. (2012)
Keyphrases
  • three dimensional
  • quasi static
  • high speed
  • multi view
  • displacement field
  • image sequences
  • d objects
  • computer vision
  • cost function
  • wireless sensor networks
  • mutual information