Modeling, verification and comparison of short-channel double gate and gate-all-around MOSFETs.

S. Kolberg H. Børli Tor A. Fjeldly

Published in: Math. Comput. Simul. (2008)

Keyphrases

multiple input
field effect transistors
nano scale
statistical analysis
modeling framework
real time
image sequences
multi channel
high density
genetic algorithm
cmos technology