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A Deep Transfer Learning Model for Packaged Integrated Circuit Failure Detection by Terahertz Imaging.

Yao LuQi MaoJingbo Liu
Published in: IEEE Access (2021)
Keyphrases
  • transfer learning
  • integrated circuit
  • machine learning
  • image processing
  • active learning
  • probabilistic model
  • failure detection
  • hierarchical bayesian model
  • decision trees
  • knowledge transfer