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Scalable Design Methodology and Online Algorithm for TSV-Cluster Defects Recovery in Highly Reliable 3D-NoC Systems.

Khanh N. DangAkram Ben AhmedYuichi OkuyamaAbderazek Ben Abdallah
Published in: IEEE Trans. Emerg. Top. Comput. (2020)
Keyphrases
  • design methodology
  • highly reliable
  • learning algorithm
  • design process
  • artificial neural networks
  • back propagation
  • convergence rate