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Fast reliability exploration for embedded processors via high-level fault injection.

Zheng WangChao ChenAnupam Chattopadhyay
Published in: ISQED (2013)
Keyphrases
  • fault injection
  • embedded processors
  • high level
  • java card
  • single chip
  • parallel implementation
  • fault model
  • smart card
  • hardware and software
  • real time
  • source code
  • static analysis