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An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs.
Roshan L. Kini
Shankar Dhakal
Sadab Mahmud
Andrew J. Sellers
Michael R. Hontz
Cheikh A. Tine
Raghav Khanna
Published in:
IEEE Access (2020)
Keyphrases
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failure rate
highly reliable
artificial intelligence
learning algorithm
high frequency
low frequency
failure prediction
databases
information retrieval
relational databases
evolutionary algorithm
probability distribution
root cause
software reliability
success or failure