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Hybrid Pattern BIST for Low-Cost Core Testing Using Embedded FPGA Core.

Gang ZengHideo Ito
Published in: IEICE Trans. Inf. Syst. (2005)
Keyphrases
  • low cost
  • low power
  • pattern matching
  • data sets
  • high speed
  • embedded systems
  • single chip
  • low power consumption
  • databases
  • neural network
  • real time image processing