Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays.
Fernando Rodríguez VarelaManuel José López MoralesRubén Tena SánchezAlfonso Tomás Muriel-BarradoElena de la Fuente GonzálezGuillermo Posada QuijanoCarlos Zarzuelo TorresManuel Sierra-PérezManuel Sierra-CastañerPublished in: Sensors (2021)