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Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays.

Fernando Rodríguez VarelaManuel José López MoralesRubén Tena SánchezAlfonso Tomás Muriel-BarradoElena de la Fuente GonzálezGuillermo Posada QuijanoCarlos Zarzuelo TorresManuel Sierra-PérezManuel Sierra-Castañer
Published in: Sensors (2021)
Keyphrases
  • simple linear
  • neural network
  • search engine
  • computer vision
  • face recognition
  • multiscale
  • data structure
  • video sequences
  • training set
  • least squares
  • test set
  • test cases
  • linear model
  • arbitrary size