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Application of Machine Model ESD tester to high volume capacitor reliability testing.

Michael MeederLeslie MarchutMichael J. AntonellMichael T. FresinaChristopher E. NovakTerry C. Darche
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high volume
  • computational model
  • management system
  • test data
  • case study
  • data processing
  • mathematical model
  • neural network
  • association rules
  • data model
  • probabilistic model
  • probability distribution
  • service providers