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, SS of 68 mV/dec, Normal-off Operation and High Positive Gate Bias Stability.
Jie Zhang
Zhuocheng Zhang
Zehao Lin
Ke Xu
Hongyi Dou
Bo Yang
Xinghang Zhang
Haiyan Wang
Peide D. Ye
Published in:
VLSI Technology and Circuits (2023)
Keyphrases
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positive and negative
low variance
wide range
image processing
data structure
databases
artificial intelligence
high speed
sufficient conditions
high precision