Signal conditioning circuits for 3D-integrated burst image sensors with on-chip A/D conversion.
Rémi BonnardJ. Segura PuchadesFabrice GuellecWilfried UhringPublished in: IMSE (2015)
Keyphrases
- image sensor
- wide dynamic range
- cmos technology
- dynamic range
- low power
- single chip
- video camera
- charge coupled device
- high speed
- digital camera
- image processing algorithms
- imaging systems
- hardware and software
- analog vlsi
- low cost
- focal plane
- motion blur
- cmos image sensor
- chip design
- high dynamic range
- low voltage
- high frequency
- power dissipation
- computer vision
- real time
- power consumption
- circuit design
- frequency domain
- spatially varying
- multiscale
- mixed signal
- transfer function
- image processing
- colour images