Causality Challenge: Benchmarking relevant signal components for effective monitoring and process control.
Michael McCannYuhua LiLiam P. MaguireAdrian JohnstonPublished in: NIPS Causality: Objectives and Assessment (2010)
Keyphrases
- process control
- intelligent control
- semiconductor manufacturing
- manufacturing process
- control system
- monitoring system
- product quality
- data sets
- closely related
- non stationary
- frequency domain
- building blocks
- computationally efficient
- real time
- image compression
- signal processing
- independent components
- neural network