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An 8 bit 0.3-0.8 V 0.2-40 MS/s 2-bit/Step SAR ADC With Successively Activated Threshold Configuring Comparators in 40 nm CMOS.

Kentaro YoshiokaAkira ShikataRyota SekimotoTadahiro KurodaHiroki Ishikuro
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • analog to digital converter
  • random access memory
  • nm technology
  • real time
  • high speed
  • power consumption
  • maximum likelihood
  • post processing
  • database applications
  • magnetic tape