Substrate noise isolation improvement by helium-3 ion irradiation technique in a triple-well CMOS process.
Ning LiTakeshi InoueTakuichi HiranoJian PangRui WuKenichi OkadaHitoshi SakaneAkira MatsuzawaPublished in: ESSDERC (2015)
Keyphrases
- random noise
- missing data
- noisy data
- noise reduction
- noise level
- additive noise
- noise model
- sensor noise
- signal to noise ratio
- gaussian noise
- magnetic recording
- data sets
- electron beam
- low signal to noise ratio
- background noise
- noise removal
- image quality
- medical images
- wavelet transform
- high resolution
- multiresolution