Robust random chip ID generation with wide-aperture clocked comparators and maximum likelihood detection.

Yunju Choi Jaeha Kim

Published in: ISCAS (2013)

Keyphrases

maximum likelihood
low cost
automatic detection
partial occlusion
low power
detection algorithm
detection accuracy
reliable detection
wide range
landmark detection
likelihood function
high speed
detection method
high density
cluttered background
physical design
computer vision
genetic algorithm