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Microelectronic materials and structures characterization by impedance spectroscopy.

Karol Nitsch
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • thin film
  • artificial intelligence
  • complex structures
  • structural features
  • website
  • database systems
  • relational databases
  • artificial neural networks
  • x ray
  • infrared
  • image structure
  • electron microscopy