SRAM Circuits for True Random Number Generation Using Intrinsic Bit Instability.
Lawrence T. ClarkSai Bharadwaj MedapuramDivya Kiran KadiyalaPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
- random number
- random number generator
- random access memory
- shift register
- pseudorandom
- random numbers
- design considerations
- random number generators
- power consumption
- low voltage
- power reduction
- uniformly distributed
- high speed
- pseudo random number generators
- cmos technology
- real time
- generation process
- flash memory
- low power
- sensor networks