Exploiting Inconsistency Problem in Multi-label Classification via Metric Learning.
Peiyan LiZhili QinHonglian WangQinli YangJunming ShaoPublished in: ICDM (2020)
Keyphrases
- metric learning
- multi label classification
- semi supervised learning
- semi supervised
- multi label
- learning tasks
- distance metric
- pairwise
- dimensionality reduction
- text categorization
- image annotation
- feature space
- labeled data
- multi task
- multi class
- distance function
- unsupervised learning
- binary classification
- learning problems
- unlabeled data
- classification algorithm
- graph cuts
- binary classifiers
- text classification
- pattern recognition
- data sets
- image classification
- supervised learning
- active learning
- neural network
- machine learning
- multi class classification