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Simplified method for measurement-based black-box harmonic stability assessment of single-phase power electronic devices.

Elias KaufholdJan MeyerCarlos Augusto DuquePeter Schegner
Published in: AMPS (2021)
Keyphrases
  • black box
  • electronic devices
  • single phase
  • data sets
  • neural network
  • high resolution
  • support vector machine svm
  • basis functions
  • test data