A Statistical Sampler for a New On-Line Analog Test Method.
Marcelo NegreirosLuigi CarroAltamiro Amadeu SusinPublished in: J. Electron. Test. (2003)
Keyphrases
- computational cost
- detection method
- cost function
- computational complexity
- clustering method
- pairwise
- prior knowledge
- probabilistic model
- support vector machine
- high precision
- statistical model
- segmentation method
- em algorithm
- test data
- statistical significance
- statistical information
- hypothesis testing
- synthetic data
- statistical analysis
- neural network
- least squares
- preprocessing
- objective function
- learning algorithm